Advance technique for automatic optical inspection process optimization
1 Citations•2016•
Wiljelm Carl K. Olalia
2016 e-Manufacturing and Design Collaboration Symposium (eMDC)
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Abstract
Customers complain has been received due to defect found at their field specifically the Scratches and Bump Defects. Ironically, defect found at their end should not be reaching since there is an AOI Process at WLCSP. Every complaint has been documented through EFAR and validated one by one.