Electrical Characterization of VLSI (Very Large Scale Integration) Memories.
88 Citations•1984•
J. Schwehr, R. Mossman, M. Majchrowski
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Automatic and bench techniques are used to characterize the performance of several VLSI memory types over the full military voltage and temperature ranges.
Abstract
Abstract : Automatic and bench techniques are used to characterize the performance of several VLSI memory types. The characterization addressed AC, DC, program and erasure parameters over the full military voltage and temperature ranges. Data summaries are presented. (Author)