Application of BIT design for electric vehicle (EV)
88 Citations•1999•
Shangguan Xiao, Pan Chun, W. Bing
Proceedings of the IEEE 1999 International Conference on Power Electronics and Drive Systems. PEDS'99 (Cat. No.99TH8475)
The built-in-test (BIT) design of electric vehicles, driven by an AC motor, requires high-reliability and easy repairability and is used in the authors' system.
Abstract
This paper describes the built-in-test (BIT) design of electric vehicles. An electric vehicle, driven by an AC motor, requires high-reliability and easy repairability. BIT design, is therefore used in the authors' system. As for the electric vehicle, BIT before task, BIT in task, and BIT for repairs are adopted. The hardware and software of the system are so designed as to meet the test requirements.