Top Research Papers on VLSI Design PDF

The rules and overall methodology governing standard cell very large scale integration (VLSI) design are described, which represents a growing trend in custom parts and falls in between the implementation of arrays of logic gates and the Implementation of full custom designs.

VLSI is concerned with forming a pattern of interconnected switches and gates on the surface of a crystal of semiconductor that has made highly sophisticated control systems mass-producable and therefore cheap.

An algorithm for performing area-time efficient division, on-line techniques for performing bit-serial calculations, and iterative algorithms for performing square root are described.

The proposed DSNN can substantially increase detection accuracy for the task of ECG heartbeat classification by doubling the input signal using a data shifting scheme so that the amount of information for training may be adequately sufficient.

Two VLSI architectures are introduced for high speed recognition of general context-free languages based on the Cocke-Younger-Kasami algorithm and Earley's algorithm.

During the period covered by the grant, two books and ten research papers were written under grant sponsorship, and nineteen of the researchpapers were written and published in conference proceeding.

This thesis is an introduction to the use of computer-aided design tools for the design of very large scale integrated circuits (VLSI) and a tutorial is given which illustrates their use in the computing environment at the Naval Postgraduate School.

A comparison between the full custom carry-save addition (CSA) multiplier designed using CAD tools and a multiplier generated by the MacPitts silicon compiler is presented.

An analysis of the MacPitts silicon compiler is presented, with the emphasis on the interrelationshp between algorithmic syntax and resulting circuit structure.

This project is to perform Analog Very Large Scaled of Integration (VLSI) testing and the analysis of combinational circuits using Computer-Aided Design (CAD) tools and the GUI is used as interface for users to explore and understand the analog combinational circuit testing.

1. Keynote Papers: Current Status, Future Trends, and Impact of VLSI (H. Nomura).

The organization of a special purpose digital computer which converts a body-fixed coordinate system is discussed in this report and the algorithm mechanized by this computer has been developed previously.

The invention relates to a very large scale integration (VLSI) standard unit overall arranging method based on an L1 form model and belongs to the technical field of VLSI physical design automation.

The implementation is based on a model of amplitude-modulation sensitivity in the central nucleus of the inferior colliculus (CNIC) previously described by Hewitt and Meddis and demonstrates the feasibility of using analog VLSI to build and test auditory models that use large numbers of component neurons.

This session discusses development of Three Dimensional Integration Technologies in Japan, European Approaches to Application-Specific Integrated Circuits, and prospects for High Speed Bipolar LSI Technology - Digital LSI Applications.

The proposed fast algorithm can reduce about 90% motion searching time, whereas PSNR only decreases about 0.02 dB on average, and VLSI architecture is designed with parallel structure and pipeline timing schedule to achieve high throughput rate for the HDTV system.

A system design to ascertain correct functioning of a VLSI circuit by using Standard IC Tester, (developed at Standford University, California), which has the capability of addressing, simulating, and measuring status of any pin of its test connector, to which an ICUT (IC Under Test) is attached.

Results will be presented which compare the computation times for the custom computer against the simulation of the Hopfield network run on a high end workstation, to illustrate a speedup of up to 2 to 3 orders of magnitude is possible using current FPGAs devices.

In this presentation, VLSI computing structures are introduced for the analysis and management of imagery data and both pattern-analysis and image-database-management capabilities into a unified system design.

Very large scale integrated circuits are difficult to test once fabricated, due to the large number of internal circuit nodes that are not accessible as probe points, and the small number of primary inputs and outputs available to exercise and observe these internal nodes.