Sequential diagnosis tool
Microprocessors and MicrosystemsPublished 1 August 2000
Alenka Žužek, Anton Biasizzo, F Novák
Citations34
SJR quartileQ2
SJR score0.49
SNIP0.92
Generate an AI Snapshot to get a quick, structured summary of this paper.
Study Snapshot
ObjectiveStudy objective
MethodsResearch methodology
PopulationPopulation studied
Sample sizeSample sizes
OutcomesStudy outcomes here
ResultsStudy results comes here
LimitationsResearch study limitations comes here
A concise AI-generated summary of the paper will appear here once you click Generate AI Snapshot.
TL;DR
The Sequential Diagnosis Tool for the generation of solutions of the test sequencing problem is presented and the advanced features of the tool are the inclusion of asymmetrical tests and tests with multiple value outcomes.
Abstract
This paper deals with the sequential diagnosis approach and the associated test sequencing problem (i.e. the problem of generating the sequence of tests required to reach a diagnostic conclusion at minimum cost). The traditional test sequencing problem is generalized here to include asymmetrical and multi-valued tests. We present the sequential diagnosis tool (SDT) that enables the user to generate solutions of the generalized test sequencing problem. SDT can be employed as a kernel of a diagnostic reasoner in automatic test equipment or system maintenance software.
Keywords
Computer ScienceEngineering
Principles of Artificial Intelligence
3,336 Citations1982Nils J. Nilsson
This classic introduction to artificial intelligence describes fundamental AI ideas that underlie applications such as natural language processing, automatic programming, robotics, machine vision, automatic theorem proving, and intelligent data retrieval.
Information Processing LettersConstructing optimal binary decision trees is NP-complete
956 Citations1976Laurent Hyafil, Ronald L. Rivest
The proof to be given is relatively simple and the importance of this result can be measured in terms of the Jarge amount of effort that has been put into fmding efftient aJgorJthms for constructing optimal binary decision trees.
IEEE Transactions on Systems Man and CyberneticsApplication of heuristic search and information theory to sequential fault diagnosis
247 Citations1990Krishna R. Pattipati, M.G. Alexandridis
System Test and Diagnosis
153 Citations1994William R. Simpson, John W. Sheppard
This chapter discusses bottom-Up Modeling for Diagnosis, a model for system level diagnosis based on the Information Flow Model, and its applications in the field of fielddiagnosis and repair.
Journal of the ACMAND/OR graph heuristic search methods
88 Citations1985Ambuj Mahanti, A. Bagchi
Two new marking algorithms for AND/OR graphs called CF and CS are presented and it is proved that CF can be followed by CS to get optimal solutions, provided the sumcost criterion is used and the first discriminant equals the second.
Acta InformaticaPerformance bounds on the splitting algorithm for binary testing
78 Citations1974M. R. Garey, Ron Graham
A number of cost-bounding results for the most common heuristic procedure, which always applies next that test yielding maximum information gain per unit cost, are derived.
IRE Transactions on Reliability and Quality ControlAn Information Theory Approach to Diagnosis
64 Citations1960R. A. Johnson
The ratio of the average information gained by performing a given test to the cost of the test is introduced as a figure of merit for the test.
IRE Transactions on Reliability and Quality ControlDiagnosis of Equipment Failures
41 Citations1960J. Brule, R. A. Johnson +1 more
IEEE Transactions on Systems Man and CyberneticsOn a generalized test sequencing problem
31 Citations1992Krishna R. Pattipati, M. Dontamsetty
The problem of constructing optimal and suboptimal test sequences to diagnose faults in modular systems with type 1 and type 2 repair options is considered and Dynamic programming recursion for this generalized test sequencing problem is derived.
The Computer JournalSequential Diagnosis with Asymmetrical Tests
15 Citations1998Anton Biasizzo
The generalization of the test sequencing problem, originally defined for symmetrical tests, that also covers asymmetrical tests is presented, proving that the same heuristics that has been employed in the traditional solution of the problem can be employed also for the generalized case.
IEEE Transactions on Systems Man and CyberneticsOn noiseless diagnosis
13 Citations1994R.W. Teung
The author introduces the cost-entropy function as an information-theoretic lower bound on C/sub min/ the expected cost of an optimal testing tree and obtains a universal upper bound of C/ sub min/ when {p/sub i/} is unknown, and a refined upper bound onC/sub Min/ when{p/ sub i/}.
IRE Transactions on Reliability and Quality ControlAn Application of the Information Theory Approach to Failure Diagnosis
12 Citations1960E. J. Kletsky
This paper demonstrates by means of a practical example the validity of a technique based on information theory which leads to highly efficient procedures for diagnosing equipment failures and the feasibility of the approach is shown.
IEEE Design & Test of ComputersWRAPLE: The Weighted Repair Assistance Program Learning Extension
10 Citations1986William R. Simpson, C.S. Dowling
The weighted repair assistance program learning extension, or WRAPLE, is a maintenance aid to help technicians isolate faults, a necessary step in system repair, from a knowledge-based information-theoretic approach that incorporates fixed experience.
Artificial intelligence exchange and service tie to all test environments (AI-ESTATE)-a new standard for system diagnostics
10 Citations2002John W. Sheppard, L.A. Orlidge
This work describes a recently approved IEEE standard for exchanging diagnostic information and embedding diagnostic reasoners in any test environment and describes the defined formats and services.