Microwave Measurements of GaAs Integrated Circuits Using Electrooptic Sampling
Published 1 January 1987
K. J. Weingarten, R. Majidi-Ahy, M.J.W. Rodwell, B. A. Auld, D. M. Bloom
Citations8
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Abstract
We describe the electrooptic sampling system at Stanford with emphasis on the requirements for microwave measurements. Results presented include internal-node measurements of 20 GHz distributed amplifiers, propagation delays in GaAs frequency dividers clocked to 18 GHz, and VSWR on IC transmission lines to 40 GHz.
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Engineering
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