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Current Dependency of the Conducting Channel Diameter in Thin-Film Glass Switches

Applied Physics LettersPublished 1 July 1971
D. Schuöcker
Citations8
SJR quartileQ1
SJR score0.90
SNIP1.00

Abstract

Measurements showed that a fast rising square-wave current pulse imposed on a thin-film As–Te–Gi–Si glass switch in the on-state causes a fast voltage rise followed by a much slower decrease. This is explained with the expansion of the conducting channel: This motion cannot follow immediately the fast rise of the current and thus the current density and the related voltage rise. During the following expansion, both quantities decrease again. The measured positive differential resistance of the on-state is referred to the current constrictions in the electrodes, caused by the small channel diameter.

Keywords

Materials ScienceEngineering