Proceedings of the 2004 Winter Simulation Conference

This work proposes an approach to obtain statistically valid estimates of security metrics by performing repeated penetration testing of detailed system models, and makes use of importance sampling techniques to help reduce the variance of the estimates, and achieve relative error bounds quickly.

Abstract

In this paper, we present the results of a simulation study for semiconductor wafer fabrication facilities (wafer fabs) where we multiplied the number of tools per tool group and the number of operators.We were interested in the effects on the product cycle times when we keep the fab utilization constant while increasing the size of the tool groups by constant factors, i.e., forming so-called giga fabs.It turns out, that the drop in cycle time is considerable.