Tailor-made tests for goodness of fit to semiparametric hypotheses
The Annals of StatisticsPublished 1 April 2006Open access
Peter J. Bickel, Ya’acov Ritov, Thomas M. Stoker
Citations68
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SJR score4.77
SNIP3.13
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Abstract
We introduce a new framework for constructing tests of general semiparametric hypotheses which have nontrivial power on the n<sup>−1/2</sup> scale in every direction, and can be tailored to put substantial power on alternatives of importance. The approach is based on combining test statistics based on stochastic processes of score statistics with bootstrap critical values.
Keywords
MathematicsEconomics, Econometrics and Finance
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