The test of time. Clock-cycle estimation and test challenges for future microprocessors
IEEE Circuits and Devices MagazinePublished 1 March 1998
P.D. Fisher, R. Nesbitt
Citations36
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Abstract
Even with aggressive new technology, the complex high-performance processor will require special design techniques and architectures to take advantage of new interconnect and transistor technology. Microprocessor on-chip clock frequencies of multiple GHz are predicted for future generations. However, significant development is necessary in technology, manufacturing, and design CAD tools in order to achieve the performance, manufacturability, and reliability desired for these future products. Design must own the test function. The ability of test to continue supporting at-speed testing has reached physical limits as well as cost impacts that will make testing a very high design priority.
Keywords
Computer ScienceEngineering
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