Some Grubbs-Type Statistics for the Detection of Several Outliers
TechnometricsPublished 1 August 1972
Gary L. Tietjen, R. W. Moore
Citations265
SJR quartileQ1
SJR score1.41
SNIP1.93
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Abstract
Several widely used tests for outlying observations are reviewed. Problems of repeated application and “masking” are described. Suggested as appropriate to over-come these problems are two new statistics: Lk which is based on the k largest (observed) values and Ek which is based on the k largest (in absolute value) residuals. Tables of approximate critical values for these statistics are given for 0.01, .025,0.05, and 0.10 levels of significance and for sample size n = 3 (1) 20 (5) 50.
Keywords
Mathematics
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