ORIGINS OF THE ITEM PARAMETERS X<sub>50</sub> AND β AS A MODERN ITEM ANALYSIS TECHNIQUE
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TL;DR
The more adequate curve fitting techniques of item analysis have long been ignored in practice due to their laborious computations, yet because of digital computers this should not be the case.
Abstract
Journal of Educational MeasurementVolume 2, Issue 2 p. 167-180 ORIGINS OF THE ITEM PARAMETERS X50 AND β AS A MODERN ITEM ANALYSIS TECHNIQUE Frank B. Baker, Frank B. Baker University of WisconsinSearch for more papers by this author Frank B. Baker, Frank B. Baker University of WisconsinSearch for more papers by this author First published: December 1965 https://doi.org/10.1111/j.1745-3984.1965.tb00412.xCitations: 10AboutPDF ToolsRequest permissionExport citationAdd to favoritesTrack citation ShareShare Give accessShare full text accessShare full-text accessPlease review our Terms and Conditions of Use and check box below to share full-text version of article.I have read and accept the Wiley Online Library Terms and Conditions of UseShareable LinkUse the link below to share a full-text version of this article with your friends and colleagues. Learn more.Copy URL Share a linkShare onFacebookTwitterLinked InRedditWechat Citing Literature Volume2, Issue2December 1965Pages 167-180 RelatedInformation