Direct electro-optic sampling of GaAs integrated circuits
Electronics LettersPublished 15 August 1985
K. J. Weingarten, M.J.W. Rodwell, H. Heinrich, Brian H. Kolner, D. M. Bloom
Citations60
SJR quartileQ3
SJR score0.27
SNIP0.44
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Abstract
We report the first electro-optic sampling measurements made directly within an integrated circuit. Using the electro-optic effect in GaAs, we have noninvasively probed the internal voltage waveforms of a 2–12 GHz GaAs FET travelling-wave amplifier integrated circuit driven by a microwave signal source.
Keywords
EngineeringPhysics and Astronomy
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