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Direct electro-optic sampling of GaAs integrated circuits

Electronics LettersPublished 15 August 1985
K. J. Weingarten, M.J.W. Rodwell, H. Heinrich, Brian H. Kolner, D. M. Bloom
Citations60
SJR quartileQ3
SJR score0.27
SNIP0.44

Abstract

We report the first electro-optic sampling measurements made directly within an integrated circuit. Using the electro-optic effect in GaAs, we have noninvasively probed the internal voltage waveforms of a 2–12 GHz GaAs FET travelling-wave amplifier integrated circuit driven by a microwave signal source.

Keywords

EngineeringPhysics and Astronomy