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A Bayesian Semiparametric Accelerated Failure Time Model

BiometricsPublished 1 June 1999
Stephen Walker, Bani K. Mallick
Citations136
SJR quartileQ1
SJR score1.26
SNIP1.20

TL;DR

A Bayesian semiparametric approach is described for an accelerated failure time model and a Markov chain Monte Carlo algorithm is described to obtain a predictive distribution for a future observation given both uncensored and censored data.

Abstract

A Bayesian semiparametric approach is described for an accelerated failure time model. The error distribution is assigned a Pólya tree prior and the regression parameters a noninformative hierarchical prior. Two cases are considered: the first assumes error terms are exchangeable; the second assumes that error terms are partially exchangeable. A Markov chain Monte Carlo algorithm is described to obtain a predictive distribution for a future observation given both uncensored and censored data.

Keywords

Computer ScienceMathematics