Picosecond optoelectronic detection, sampling, and correlation measurements in amorphous semiconductors
Applied Physics LettersPublished 15 August 1980
D. H. Auston, Anthony Johnson, P. R. Smith, J. C. Bean
Citations225
SJR quartileQ1
SJR score0.90
SNIP1.00
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Abstract
The rapid relaxation of the photoresponse of high-defect-density amorphous semiconductors such as evaporated a-Si has been utilized to develop an electronic measurement capability which can generate and sample electronic transients with speeds ≲10 ps.
Keywords
Materials ScienceEngineering
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