Parameter variations and impact on circuits and microarchitecture
Published 2 June 2003
Shekhar Borkar, Tanay Karnik, S. Narendra, Jim Tschanz, A. Keshavarzi, Vivek De
Citations1,406
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TL;DR
Process, voltage and temperature variations; and their impact on circuit and microarchitecture; and possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are presented.
Abstract
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltage and temperature variations; and their impact on circuit and microarchitecture. Possible solutions to reduce the impact of parameter variations and to achieve higher frequency bins are also presented.
Keywords
Engineering
Parameter variations and impact on circuits and microarchitecture
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