Measuring and Testing
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Abstract
The RF measurements are an inseparable part of the microwave integrated technology. By measurement, data are obtained concerning real characteristics of materials and structural elements, necessary in modelling, analysis and designing the future MIC, measurement serves for checking and classifying materials and parts prior to the production (measurements of the permittivity of substrates, choice of low-noise transistor chips), and last, measurements serve for complex testing of the final MICs. The set of high-frequency characteristics obtained by measurement is also an important basic material for the future application of the given MIC.
